
Monografiya yavlyaetsya pervym i poka edinstvennym na russkom yazyke sistematicheskim izlozheniem odnogo iz naibolee vostrebovannykh napravleniy strukturnogo testirovaniya v sovremennoy elektronike – tekhnologiy granichnogo skanirovaniya (JTAG) i testoprigodnogo proektirovaniya (DFT), a takzhe vnutriskhemnogo testirovaniya (ICT), i v ravnoy stepeni mozhet sluzhit' kak uchebnikom dlya studentov i p...
Paperback: 308 pages
Publisher: Palmarium Academic Publishing (May 23, 2012)
Language: Russian
ISBN-10: 3847393243
ISBN-13: 978-3847393245
Product Dimensions: 5.9 x 0.7 x 8.7 inches
Format: PDF ePub fb2 TXT fb2 book
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ey inzhenernykh, elektronnykh i komp'yuternykh spetsial'nostey universitetov i kolledzhey s prepodavaniem sootvetstvuyushchikh kursov, tak i spravochnikom dlya inzhenerov i tekhnikov, rabotayushchikh v promyshlennosti vysokikh tekhnologiy. Kniga okhvatyvaet vvedenie v standarty tsifrovogo IEEE (1149.1) i analogovogo (1149.4) granichnogo skanirovaniya, rasshirenie etogo standarta na differentsial'nye LVDS-tsepi (1149.6), novyy dvukhkontaktnyy JTAG standart 1149.7, vnutriskhemnoe konfigurirovanie PLM i FPGA, struktury SnK i noveyshiy standart testoprigodnogo proektirovaniya mikroskhem R1687. V knige sdelan obzor naibolee rasprostranennykh programmno-apparatnykh sredstv podderzhki tekhnologii JTAG (ProVision, onTAP, ScanExpress, ScanWorks, XJTAG) i privedeno mnozhestvo primerov, a takzhe vvedenie vo vnutriskhemnoe testirovanie ICT.